Preface to the Reissue of the Materials Characterization Series

Preface to Series

Preface to the Reissue of Characterization of Metals andAlloys

Preface

Acronyms Glossary

Contributors

INTRODUCTION

　1.1 Purpose and Organization of the Book

MECHANICAL PROPERTIES AND INTERFACIAL ANALYSIS

　2.1 Introduction

　2.2 Grain Boundary Segregation

　2.3 Temper Embrittlement

　2.4 Corrosion and Stress Corrosion Cracking

　2.5 Hydrogen Embrittlement

　2.6 Creep Embrittlement

　2.7 Future Directions

CHEMICAL PROPERTIES

　3.1 Introduction

　3.2 Tools of the Trade--Unique Information Available

　3.3 Gaseous Corrosion

　3.4 Aqueous Corrosion

　3.5 Surface Electronic Structure and Chemistry

　3.6 Surface Modification

　3.7 Summary

SURFACE AND THIN FILM ANALYSIS OF DIFFUSION IN METALS

　4.1 Introduction

　4.2 The Mathematics of Diffusion

　4.3 Effects of Non-Uniform Cross Sections

　4.4 Effects of Finite Thickness

　4.5 Analysis Techniques for Diffusion

　4.6 Case Studies of Diffusion

　4.7 Summary

MINERAL PROCESSING AND METAL RECLAMATION

　5.1 Introduction

　5.2 Techniques for Mineral Surface Characterization

　5.3 Surface Bonding in Mineral-Fluid Systems

　5.4 Complementary Composition Analyses of Rough and Polished Surfaces

　5.5 Summary

MELTING AND CASTING

　6.1 Introduction

　6.2 Aluminum-Lithium Alloys

　6.3 Aluminum-Magnesium Alloys

　6.4 Rapidly Solidified Aluminum Alloy Powders

　6.5 Cast Aluminum Alloy Metal Matrix Composites

　6.6 Liquid Aluminum Alloys

　6.7 Summary

MACHINING AND WORKING OF METALS

　7.1 Introduction

　7.2 Physical and Chemical Characterization

　7.3 Lubrication

　7.4 Surface Finish

　7.5 Metalworking Example

　7.6 Summary

CHARACTERIZATION OF THE CLEANING OF SURFACES OF METALS AND METAL ALLOYS

　8.1 Introduction

　8.2 Characterization of Cleaning Procedures

　8.3 Specimen Handling and Interpretation of Data

　8.4 Summary

COATINGS AND THIN FILMS

　9.1 Introduction

　9.2 Techniques for Creating Coatings and Thin Films

　9.3 Techniques to Characterize Coatings and Thin Films

　9.4 Studies of Coatings on Metals

　9.5 Studies of Thin Films on Metals

　9.6 Summary

FAILURE ANALYSIS

　10.1 Introduction

　10.2 Collaboration with the Applications Engineering Team

　10.3 Failure Analysis Case Histories

　10.4 Summary

APPENDIX: TECHNIQUE SUMMARIES

　1 Auger Electron Spectroscopy (AES)

　2 Cathodoluminescence (CL)

　3 Dynamic Secondary Ion Mass Spectrometry (Dynamic SIMS)

　4 Elastic Recoil Spectrometry (ERS)

　5 Electron Energy-Loss Spectroscopy in the Transmission Electron Microscope (EELS)

　6 Electron Probe X-Ray Microanalysis (EPMA)

　7 Energy-Dispersive X-Ray Spectroscopy (EDS)

　8 Extended X-Ray Absorption Fine Structure (EXAFS)

　9 Field Ion Microscopy (FIM)

　10 Fourier Transform Infrared Spectroscopy (FTIR)

　11 Glow-Discharge Mass Spectrometry (GDMS)

　12 High-Resolution Electron Energy Loss Spectroscopy (HREELS)

　13 Inductively Coupled Plasma Mass Spectrometry (ICPMS)

　14 Inductively Coupled Plasma-Optical Emission Spectroscopy(ICP-OES)

　15 Ion Scattering Spectroscopy (ISS)

　16 Laser Ionization Mass Spectrometry (LIMS)

　17 Low-Energy Electron Diffraction (LEED)

　18 Low-Energy Electron Microscopy (LEEM)

　19 Magneto-Optic Kerr Effect (MOKE)

　20 Medium-Energy Ion Scattering with Channeling and Blocking (MEIS)

　21 Neutron Activation Analysis (NAA)

　22 Nuclear Reaction Analysis (NRA)

　23 Optical Micro-Reflectometry (OMR) and Differential Reflectometry (DR)

　24 Optical Second Harmonic Generation (SHG)

　25 Particle-Induced X-Ray Emission (PIXE)

　26 Photoacoustic Spectroscopy (PAS)

　27 Photoelectron Emission Microscopy (PEEM)

　28 Photoluminescence (PL)

　29 Reflected Electron Energy-Loss Spectroscopy (REELS)

　30 Reflection High-Energy Electron Diffraction (RHEED)

　31 Rutherford Backscattering Spectrometry (RBS)

　32 Scanning Electron Microscopy (SEM)

　33 Scanning Transmission Electron Microscopy (STEM)

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